Laue microdiffraction characterisation of as-cast and tensile deformed Al microwires

Figures & data

Table 1. Main characteristics of the studied microwires.

Sample	Dia. (μm)	Initial axis orientation	Total strain to failure${}^{\mathrm{a}}$ [−]
As-cast	14.5	[2 5 10]	–
Single slip oriented SS1	14.6	[0 4 3]	0.83
Single slip oriented SS2	14.0	[0 3 5]	0.24
Multiple slip oriented MS	14.7	[1 1 1]	0.61

${}^{\mathrm{a}}$Resolved shear strain accumulated during tensile testing before Laue X-ray microdiffraction characterisation.

Figure 1. SEM image of a portion of the characterised as-cast microwire and contour plot of GND density $\log {\rho }_{\mathit{G}\mathit{N}\mathit{D}}\left[{\mathrm{m}}^{-2}\right]$ over a length of 500 $\mu \mathrm{m}$.

Figure 2. (a) SEM image and contour plots of (b) misorientation angle [${}^{\circ }$] and (c) dislocation density $\log {\rho }_{\mathit{G}\mathit{N}\mathit{D}}\left[{\mathrm{m}}^{-2}\right]$ in single-slip oriented microwire SS1. (d) Intensity distribution of 6 diffraction peaks at two locations (indicated by labels 1 and 2 on the above maps) and theoretical streaking directions for the glide systems a3, c5 and b2 (Schmid factors before/after deformation of respectively $m_s=$ 0.46/0.41, 0.11/0.41 and 0.34/0); window size : $50\times 50$ pixels.

Figure 4. Streaking of 3 diffraction peaks in single-slip oriented microwire SS2 (a) around the largest visible slip step and (b) within two areas separated by a small step; window size : $50\times 50$ pixels.

Figure 5. SEM image of a deformed microwire initially oriented for multiple-slip; contour plot of misorientation angle [${}^{\circ }$] (left) and dislocation density $\log {\rho }_{\mathit{G}\mathit{N}\mathit{D}}\left[{\mathrm{m}}^{-2}\right]$ (right).