Abstract
In situ and real-time observation of 2-dimensional grazing incidence x-ray diffraction (2D-GIXD) during growth of pentacene thin films were carried out using a newly home-built portable vacuum deposition chamber using synchrotron radiation at SPring-8. Crystal growth and successive polymorphic transformation from thin film phase to bulk phase are clearly observed at room temperature and 75°C. A distinct orientation of bulk phase characterized by tilted (001) plane is found in the grown thin films at room temperature.
Acknowledgments
The authors would like to thank Mamoru Kikuchi (Iwate Univ.) for his technical support on the measurement system. This synchrotron radiation experiments were performed at BL19B2 in SPring-8 with the approval of Japan synchrotron Radiation Research Institute (JASRI) (Proposal No. 2011A0036).