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Articles

Influence of A-site cation on the thermal stability of metal halide perovskite polycrystalline films

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Pages 53-60 | Received 30 Oct 2017, Accepted 26 Dec 2017, Published online: 01 Feb 2018

Figures & data

Figure 1. SEM images of the MAPbBr3 polycrystalline films with different thermal annealing conditions: (a) without annealing; (b) annealed at 70°C for 10 min; (c) annealed at 120°C for 10 min; (d) annealed at 180°C for 10 min; (e) annealed at 180°C for 30 min; and (f) annealed at 230°C for 30 min.

Figure 1. SEM images of the MAPbBr3 polycrystalline films with different thermal annealing conditions: (a) without annealing; (b) annealed at 70°C for 10 min; (c) annealed at 120°C for 10 min; (d) annealed at 180°C for 10 min; (e) annealed at 180°C for 30 min; and (f) annealed at 230°C for 30 min.

Figure 2. SEM images of the CsPbBr3 polycrystalline films with different thermal annealing conditions: (a) without annealing; (b) annealed at 70°C for 10 min; (c) annealed at 120°C for 10 min; (d) annealed at 180°C for 10 min; (e) annealed at 180°C for 30 min; and (f) annealed at 230°C for 30 min.

Figure 2. SEM images of the CsPbBr3 polycrystalline films with different thermal annealing conditions: (a) without annealing; (b) annealed at 70°C for 10 min; (c) annealed at 120°C for 10 min; (d) annealed at 180°C for 10 min; (e) annealed at 180°C for 30 min; and (f) annealed at 230°C for 30 min.

Figure 3. XRD patterns of (a) MAPbBr3 and (b) CsPbBr3 polycrystalline films with different thermal annealing conditions. (c) Magnified XRD pattern of the MAPbBr3 films annealed at 230°C for 30 min (bottom) and calculated pattern of PbBr2 (top) [Citation30].

Figure 3. XRD patterns of (a) MAPbBr3 and (b) CsPbBr3 polycrystalline films with different thermal annealing conditions. (c) Magnified XRD pattern of the MAPbBr3 films annealed at 230°C for 30 min (bottom) and calculated pattern of PbBr2 (top) [Citation30].

Table 1. XRD peak positions of the MAPbBr3 polycrystalline films depending on the thermal annealing condition.

Table 2. XRD peak positions of the CsPbBr3 polycrystalline films depending on the thermal annealing condition.

Table 3. Lattice parameters of the MAPbBr3 and CsPbBr3 polycrystalline films depending on the thermal annealing condition.

Figure 4. Steady-state PL spectra of the (a) MAPbBr3 and (b) CsPbBr3 polycrystalline films after annealing at 70°C, 120°C, or 180°C for 10 min.

Figure 4. Steady-state PL spectra of the (a) MAPbBr3 and (b) CsPbBr3 polycrystalline films after annealing at 70°C, 120°C, or 180°C for 10 min.

Figure 5. PL lifetime curves of the (a) MAPbBr3 and (b) CsPbBr3 polycrystalline films after annealing at 70°C, 120°C, or 180°C for 10 min.

Figure 5. PL lifetime curves of the (a) MAPbBr3 and (b) CsPbBr3 polycrystalline films after annealing at 70°C, 120°C, or 180°C for 10 min.

Table 4. Short PL lifetime (), long PL lifetime (), and average lifetime () of the MAPbBr3 and CsPbBr3 polycrystalline films depending on TANN ( is a statistical measure that evaluates the goodness of fit (the closer is to 1, the higher the fitting quality).