Raman spectroscopy of nanocrystalline Mn-doped BiFeO₃ thin films

Figures & data

Figure 1. XRD patterns of Bi_1.05Fe_{1− x} Mn _x O₃ (x = 0, 0.01, 0.02, 0.03, 0.04 and 0.05) thin films deposited on ITO/glass substrates.

Figure 2. Magnified XRD patterns of BiFe_{1− x} Mn _x O₃ (x = 0, 0.01, 0.02, 0.03, 0.04 and 0.05) thin films in the vicinity of 2θ = 32° showing merging and shifting of (104) and (110) diffraction peaks towards higher angle.

Figure 3. Room-temperature unpolarised Raman spectra of BiFe_{1− x} Mn _x O₃ (x = 0, 0.01, 0.02, 0.03, 0.04 and 0.05) thin films deposited on silicon (100) substrates.

Figure 4. Room-temperature (M–H) hysteresis loop of BiFe_{1− x} Mn _x O₃ (x = 0, 0.01, 0.02, 0.03, 0.04 and 0.05) thin films deposited on silicon (100) substrates, in which inset shows the variation in M _s with Mn-doping concentration.

Figure 5. Leakage current density–electric field (J–E) curves (semilogarithmic plot) of Pt/BiFe_{1− x} Mn _x O₃/ITO/glass (x = 0, 0.01, 0.02, 0.03, 0.04 and 0.05) thin-film capacitors.