Figures & data
Figure 1. Cross section of D-MEMS in passive state (upper left) and actuated state (lower left), with their corresponding diffraction patterns (right).
![Figure 1. Cross section of D-MEMS in passive state (upper left) and actuated state (lower left), with their corresponding diffraction patterns (right).](/cms/asset/88cf08d0-5af9-48b7-8c15-7d4fd051ad2c/tjen_a_202313_o_f0001g.gif)
Table 1. Dimensions of rulings used in capacitance simulations.
Table 2. Constants for electrostatic force including fringe-field effect.
Figure 3. Comparison of analytical equations and simulation of electrostatic force as function of air gap for 2 µm wide ruling-electrode model.
![Figure 3. Comparison of analytical equations and simulation of electrostatic force as function of air gap for 2 µm wide ruling-electrode model.](/cms/asset/0c05d747-ba66-4aee-97a2-6407efdb55e3/tjen_a_202313_o_f0003g.gif)
Figure 4. Schematic (not to scale) of: (a) Double-Clamped design, (b) Cantilever-Suspension design, and (c) Double Grating design.
![Figure 4. Schematic (not to scale) of: (a) Double-Clamped design, (b) Cantilever-Suspension design, and (c) Double Grating design.](/cms/asset/c50e63f0-f3b3-45de-9ac3-bbcecd2fcb04/tjen_a_202313_o_f0004g.gif)
Figure 5. Double-Clamped device results: (a) SEM image showing the anchor and rulings, (b) WLI result showing 80 nm centre ruling buckling on average.
![Figure 5. Double-Clamped device results: (a) SEM image showing the anchor and rulings, (b) WLI result showing 80 nm centre ruling buckling on average.](/cms/asset/5b84e28d-159a-40ca-a59e-51ab5b99b35a/tjen_a_202313_o_f0005g.gif)