Long-term stability and thickness dependence of magnetism in thin (Cr_0.5Mn_0.5)₂GaC MAX phase films

Figures & data

Figure 1. (a) θ–2θ X-ray diffractograms of 40.3 nm (red) and 156 nm (black) thick (Cr_0.5Mn_0.5)₂GaC films. (b–e) Scanning electron microscopy images of (Cr_0.5Mn_0.5)₂GaC film surfaces for film thickness d = 12.5, 20.8, 40.3 and 156 nm.

Figure 2. (a) FMR spectra of (Cr_0.5Mn_0.5)₂GaC films with different thickness measured at the temperature of T = 110 K. The ‘noisy’ features from 0.31 to 0.37 T are electron paramagnetic resonance (EPR) signals from impurities in the MgO substrate. (b) Temperature dependence of the FMR field $H_{\mathrm{r}}$ for different thicknesses of (Cr_0.5Mn_0.5)₂GaC films, solid lines are a guide to the eye.

Figure 3. FMR spectra of the (Cr_0.5Mn_0.5)₂GaC film with the thickness of d = 20.8 nm recorded in the time interval of 1 year.