Figures & data
Figure 1. (a) γ/γ′-structure and distribution of γ′-size (in-set image), cross-sectional view of fracture surfaces and macroscopic fracture morphology (in-set images) after TMF failure at (b) IP-TMF and (c) OP-TMF, (d) cyclic stress response curves, evolution of hysteresis loops of the experimental alloy during (e) IP-TMF and (f) OP-TMF.
![Figure 1. (a) γ/γ′-structure and distribution of γ′-size (in-set image), cross-sectional view of fracture surfaces and macroscopic fracture morphology (in-set images) after TMF failure at (b) IP-TMF and (c) OP-TMF, (d) cyclic stress response curves, evolution of hysteresis loops of the experimental alloy during (e) IP-TMF and (f) OP-TMF.](/cms/asset/eaec3993-84a3-4f9e-ac93-c2eb49a851ec/tmrl_a_2223558_f0001_oc.jpg)
Figure 2. The EBSD analysis of typical pores near fracture surface after (a-c) IP-TMF and (d-f) OP-TMF cycling. (a) and (d) BSD maps, (b) and (e) IPF, (c) and (f) KAM maps. Inset of (e) displaying the typical orientation angle of the twinning bands.
![Figure 2. The EBSD analysis of typical pores near fracture surface after (a-c) IP-TMF and (d-f) OP-TMF cycling. (a) and (d) BSD maps, (b) and (e) IPF, (c) and (f) KAM maps. Inset of (e) displaying the typical orientation angle of the twinning bands.](/cms/asset/34e7bd78-61f8-4794-8eb7-65727eeef6eb/tmrl_a_2223558_f0002_oc.jpg)
Figure 3. (a) Bright TEM image of the deformed structure close to micro-pore after IP-TMF, (b) high resolution images of APB (relatively low Z-contrast) in γ′ phase, (c) high resolution image of dislocation configuration crosses the γ/γ′-interface at IP-TMF, (d) bright TEM image of the pore-induced twin after OP-TMF, (e) contrast observation of dark TEM as well as selective diffraction patterns of the pore-induced twin, (f) high resolution image showing the nucleation of deformation twin at OP-TMF.
![Figure 3. (a) Bright TEM image of the deformed structure close to micro-pore after IP-TMF, (b) high resolution images of APB (relatively low Z-contrast) in γ′ phase, (c) high resolution image of dislocation configuration crosses the γ/γ′-interface at IP-TMF, (d) bright TEM image of the pore-induced twin after OP-TMF, (e) contrast observation of dark TEM as well as selective diffraction patterns of the pore-induced twin, (f) high resolution image showing the nucleation of deformation twin at OP-TMF.](/cms/asset/3ed1205d-49ee-4866-ba46-4e7bb338a250/tmrl_a_2223558_f0003_oc.jpg)
Figure 4. (a) High resolution image illustrating that the extension of deformation twin was partially impeded by γ/γ′-interface, (b) characteristic of typical CTB and ITB in the γ′ particle. HRSTEM-EDS element mapping displaying the element segregation at the γ/γ′-interface and CTB in γ′ phase (white cycle).
![Figure 4. (a) High resolution image illustrating that the extension of deformation twin was partially impeded by γ/γ′-interface, (b) characteristic of typical CTB and ITB in the γ′ particle. HRSTEM-EDS element mapping displaying the element segregation at the γ/γ′-interface and CTB in γ′ phase (white cycle).](/cms/asset/f72faf3e-f1ed-44f1-af44-f85e42464de5/tmrl_a_2223558_f0004_oc.jpg)
Figure 5. Schematic illustration of the formation and evolution of pore-induced defects as well as TMF fracture features in fourth-generation SX superalloy during IP- and OP-TMF processes. (a1) characteristic of flat fracture and horizontal cracking at IP-cycling, (a2) procedures of crack initiation and propagation as well as introduction of recrystallizations, (a3) evolution of dislocation configurations during consecutive high-temperature and low-temperature half cycles, (b1) characteristic of crystallographic fracture and cracking at OP-cycling, (b2) mechanisms of twinning formation and propagation as well as cracking along twinning boundary, (b3) evolution of dislocation configurations and contraction of twins during OP-TMF.
![Figure 5. Schematic illustration of the formation and evolution of pore-induced defects as well as TMF fracture features in fourth-generation SX superalloy during IP- and OP-TMF processes. (a1) characteristic of flat fracture and horizontal cracking at IP-cycling, (a2) procedures of crack initiation and propagation as well as introduction of recrystallizations, (a3) evolution of dislocation configurations during consecutive high-temperature and low-temperature half cycles, (b1) characteristic of crystallographic fracture and cracking at OP-cycling, (b2) mechanisms of twinning formation and propagation as well as cracking along twinning boundary, (b3) evolution of dislocation configurations and contraction of twins during OP-TMF.](/cms/asset/ab0323a1-aa1f-4c98-bffc-723e80bd1d92/tmrl_a_2223558_f0005_oc.jpg)