Study of nanostructured Al doped ZnO films

Abstract

Electroless Al doped ZnO nanostructured thin films were deposited on soda lime glass in the present work. The wet deposited films were dried in air and subsequently annealed in a muffle furnace in air environment. The film deposited samples were characterised by field emission SEM/energy dispersive spectroscopy, X-ray diffraction and ultraviolet-visible spectrophotometer. Microstructure of the Al doped ZnO film is strongly affected by increasing the deposition time and annealing temperature. Surface and cross-sectional morphology of Al doped ZnO film exhibited the dense microstructure as compared to undoped ZnO films. X-ray analysis shows a (101) preferential growth in all the films. The optical properties of the films were analysed in the spectral range of 300–800 nm. The obtained samples are highly transparent with a visual transmittance of >80% at 450 nm.

Keywords:

• Spectrophotometer
• FESEM
• XRD
• Transmittance