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ORIGINAL RESEARCH

Optical Bench Evaluation of the Latest Refractive Enhanced Depth of Focus Intraocular Lens

ORCID Icon & ORCID Icon
Pages 1921-1932 | Received 20 Mar 2024, Accepted 21 Jun 2024, Published online: 03 Jul 2024

Figures & data

Figure 1 WaveMaster® IOL 2 test setup.

Figure 1 WaveMaster® IOL 2 test setup.

Figure 2 (A and B) Through frequency MTF of PureSee® IOL. Through frequency MTF with different defocus, 3 mm aperture (A) and 4.5 aperture (B), with special interest for MTF between 0 and 100 lp/mm.

Figure 2 (A and B) Through frequency MTF of PureSee® IOL. Through frequency MTF with different defocus, 3 mm aperture (A) and 4.5 aperture (B), with special interest for MTF between 0 and 100 lp/mm.

Figure 3 (A and B) Through focus MTF of PureSee® IOL. Through focus MTF at 50 lp/mm for an aperture of 3 mm (A) and 4.5 mm (B).

Figure 3 (A and B) Through focus MTF of PureSee® IOL. Through focus MTF at 50 lp/mm for an aperture of 3 mm (A) and 4.5 mm (B).

Figure 4 (A and B) MTFa of PureSee® IOL. Area under the modulation transfer function curve (MTFa) at defocus 0 D to −3 D, for an aperture of 3 mm (A) and 4.5 mm (B).

Figure 4 (A and B) MTFa of PureSee® IOL. Area under the modulation transfer function curve (MTFa) at defocus 0 D to −3 D, for an aperture of 3 mm (A) and 4.5 mm (B).

Figure 5 (A and B) Simulated visual acuity. Simulated visual acuity for 3 mm aperture (A) and 4.5 aperture (B) at defocus 0 D to −3 D.

Figure 5 (A and B) Simulated visual acuity. Simulated visual acuity for 3 mm aperture (A) and 4.5 aperture (B) at defocus 0 D to −3 D.

Table 1 Higher Order Aberrations (Zernike Polynomials) Obtained for TECNIS® PureSee® IOL. Significant Zernike Coefficients are Found to Be Primary and Secondary Spherical Aberration (>0.2 µm)

Figure 6 2D Wavefront mapping (Shack-Hartmann) of TECNIS® PureSee® IOL.

Figure 6 2D Wavefront mapping (Shack-Hartmann) of TECNIS® PureSee® IOL.

Figure 7 Detailed, meridionally averaged wavefront (red) and calculated power (blue) profile of PureSee® IOL (Shack-Hartmann Sensor). The central dip represents an artifact caused by wavefront reconstruction.

Figure 7 Detailed, meridionally averaged wavefront (red) and calculated power (blue) profile of PureSee® IOL (Shack-Hartmann Sensor). The central dip represents an artifact caused by wavefront reconstruction.

Data Sharing Statement

All data analyzed in this study are included in this article. Further inquiries can be directed to the corresponding author.