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Advances in Physics Volume 30, 1981 - Issue 4
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Original Articles

Optically detected magnetic resonance (O.D.M.R.) investigations of recombination processes in semiconductors

B.C. Cavenett Department of Physics, University of Hull, Hull, England
Pages 475-538 | Received 12 Feb 1981, Published online: 28 Jul 2006
 
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Abstract

This review covers results of recent O.D.M.R. measurements of recombination processes in layered semiconductors, II–VI compounds, at dep traps and in amorphous compounds, and includes consideration of experimental aspects.

Based on unpublished invited paper presented at the International Conference on High Magnetic Field Measurements in Semiconductors, Oxford, 1978.

Based on unpublished invited paper presented at the International Conference on High Magnetic Field Measurements in Semiconductors, Oxford, 1978.

Notes

Based on unpublished invited paper presented at the International Conference on High Magnetic Field Measurements in Semiconductors, Oxford, 1978.

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