Abstract
The effects of the substitution of nickel by gallium on the structures and the electrochemical properties of LaNi5-xGax (x = 0.1−0.5) alloys were studied systematically. The structure of the alloy was tested by X-ray diffraction (XRD) measurements. Electrochemical properties and battery parameters were measured by bipotentiostat and battery tester equipment. The results showed that when gallium is doped into alloys, the lattice of the LaNi5-xGax is slightly increased but retains the CaCu5 structure. Gallium has a low melting temperature. When gallium replaces nickel in the LaNi5 alloy, it covers material particles and reduces oxidation process, which leads to a longer lifetime and makes charge/discharge process more stable. The shapes of electrochemical impedance spectroscopy measurements of all the LaNi5-xGax samples were similar, and the value increases as the substitution of Ni by Ga increases. The cyclic voltammograms of all the LaNi5-xGax samples were similar to the one of pure LaNi5. For the same Ga-doped concentration and experimental conditions, the current density Jmax and charge quantity Q of the samples were increased cycle by cycle of charge/discharge.