Abstract
In this paper, we introduce two novel strategies to reduce artifacts in the direct sampling type methods (DSM). The newly proposed techniques can essentially reduce the artifacts and provide more accurate and reliable physical profiles of the scatterers compared with the original DSM. The techniques can find wide applications in the inverse scattering problems. Moreover, the novel techniques exhibit several strengths: direct, stable, robust, and ease of implementation.
Acknowledgements
The author would like to thank the anonymous referees for their insightful and constructive comments and Prof. Yang, Jiaqing and Dr. Chow, Yat Tin for their valuable discussions and suggestions, which have led to a clear improvement of the work.
Notes
No potential conflict of interest was reported by the author.