Abstract
The quantification of silicon (Si) in plant samples is being requested more frequently, especially in agricultural laboratories associated with the determination of nutritional requirements of sugarcane (Saccharum officinarum L.) and rice (Oryza sativa L.). The analysis of plant material for Si can be protracted, especially if laboratories do not have access to X‐ray flourescence (XRF) instrumentation and large numbers of samples are involved. A simplified procedure using equipment considered standard in most agricultural laboratories is reported. Dry, ground plant material is subjected to nitric acid/peroxide oxidation in a low‐pressure laboratory microwave digestion system. The hydrated silica liberated from the organic matrix is dissolved in a small volume of sodium hydroxide solution also using the microwave digestion system. Silicon is measured by inductively coupled plasma atomic emission spectrometry (ICP‐AES). This method gives results that are linearly correlated with the much slower conventional techniques and avoids using hazardous chemicals (hydrofluoric acid) sometimes employed in other microwave methods.