Mode analysis of low frequency dielectric losses in surface stabilized ferroelectric liquid crystal

Abstract

Low frequency dielectric constant data of a surface stabilized ferroelectric liquid crystal (SSFLC) sample was analyzed by use of the Tikhonov regularization method to confirm three distinctive modes of relaxation corresponding to the X-mode, D-mode, and L-mode. The mode dependence on the probe field strength was studied in detail for two different cases of surface treatments: one with the indium tin oxide (ITO) coating only and the other with polyimide dressing and rubbing alignment on top of the ITO coating. Origins of the three relaxation modes were discussed on the basis of the observed effects of the different surface treatments.

Key Words:

• low frequency mode
• dielectric relaxation
• ferroelectric liquid crystal
• Tikhonov regularization