Abstract
The switching process in deuterated glycine phosphite crystal (DGPI) has been investigated by microscopic observation of domain structure using nematic liquid crystal (NLC) decoration technique and by switching current registration in high electric fields. The stabilization mechanism of 180° domains appears to have a correlation to a defect—induced internal bias field in the crystal.
Acknowledgement
This work was supported by the University of Wrocław under the grant 2016/W/IFD/03.