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Original Articles

Optical Function of LiNbO3 and Nb2O5 Transparent Thin Films

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Pages 131-133 | Received 01 Aug 2003, Accepted 01 Jan 2004, Published online: 07 Sep 2010
 

Abstract

A procedure is presented for accurately determining the thickness, optical functions and surface-roughness characteristics of LiNbO3 and Nb2O5 from ellipsometry data. For films with minimal surface roughness, the optical functions can be determined over the entire measured spectrum; for rougher films, the analysis of the spectroscopic ellipsometry data yields meaningfull values of the optical functions only in the transparent region. In general, the films must be transparent in a given range of wavelengths sampled by the ellipsometer so that at least two interference oscillations can be observed. The use of the procedure is illustrated with the determination of the optical functions of LiNbO3 and Nb2O5 thin films. The thin film results are compared with the measured optical functions of the respective bulk materials.

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