17
Views
1
CrossRef citations to date
0
Altmetric
SECTION B: APPLICATIONS

Terabit Per Square Inch Information Data Storage on Ferroelectrics with Low Bit Error Rate

, &
Pages 99-106 | Received 26 Jan 2006, Published online: 09 Mar 2011
 

The bit error rate was evaluated in ultrahigh-density ferroelectric data storage based on scanning nonlinear dielectric microscopy. Data bits were written on ferroelectric media in the form of the polarization direction of nanodomains. Information data were recorded on a LiTaO 3 single-crystal at the density of 260 Gbit/inch2 using the probe with the tip radius of 50 nm. There were no bit errors out of ten-thousand bits under the optimized conditions, thus bit error rate was less than 1 × 10−4. Sharp probes with the tip radius of 25 nm enabled recording at the density of 982 Gbit/inch2 with a few bit errors.

Acknowledgments

Paper originally presented at IMF-11, Iguassu Falls, Brazil, September 5–9, 2005;

Log in via your institution

Log in to Taylor & Francis Online

PDF download + Online access

  • 48 hours access to article PDF & online version
  • Article PDF can be downloaded
  • Article PDF can be printed
USD 61.00 Add to cart

Issue Purchase

  • 30 days online access to complete issue
  • Article PDFs can be downloaded
  • Article PDFs can be printed
USD 2,630.00 Add to cart

* Local tax will be added as applicable

Related Research

People also read lists articles that other readers of this article have read.

Recommended articles lists articles that we recommend and is powered by our AI driven recommendation engine.

Cited by lists all citing articles based on Crossref citations.
Articles with the Crossref icon will open in a new tab.