Dielectric measurements of Cs 2 SO 4 show a distinct relaxation at low frequencies at several isotherms (T < 651°C). For example, the relaxation frequency is around 5.1 kHz at 376°C and increases to approximately 1 MHz at 651°C. The relaxation has an activation energy of 0.97 eV, which is in close agreement whit that of Cs+ transport. We suggest that the observed dielectric relaxation could be produced by the Cs+ jump and SO 4 − reorientation that cause distortion and change the local lattice polarizability inducing dipoles like CsSO 4 −.
Acknowledgments
The authors would like to acknowledge the support of the Colombian Research Agency, COLCIENCIAS, the International Program in the Physical Sciences, IPPS, of Uppsala, Sweden and CYTED (Electroceramic), Spain.
Paper originally presented at IMF-11, Iguassu Falls, Brazil, September 5–9, 2005