The necessity of producing materials with better performances than those observed in ferroelectric perovskites has induced the investigation of new oxides, especially those belonging to the Aurivillius family which exhibit better performance than PZT in non-volatile ferroelectric memories (FeRAM). In this contribution a Raman analysis of Bi2-xTexSrNb2-xHfxO9 (x = 0.10) is carried out to investigate the vibrational spectra and the ferro-paraelectric phase transition of these compounds.
Acknowledgments
Paper originally presented at IMF-11, Iguassu Falls, Brazil, September 5–9, 2005