High Resolution X-Ray Characterization of Sub-Micron Periodic Domain Structures in Lithium Niobate Crystals

Abstract

The High Resolution X-Ray Diffraction technique in the reciprocal space mapping mode is exploited to study sub-micron periodic domain structures in lithium niobate crystals. Periodic satellite structure were detected around the reciprocal lattice points which carry information on the domain period and shape and also on the presence of lattice deformations. Moreover a pronounced diffuse scattering peak was observed, indicating the presence of a random displacement field possibly associated to the presence of randomly distributed structural defect.

Keywords:

• Periodically Poled Lithium Niobate
• high resolution X-Ray diffraction
• diffuse scattering

Acknowledgments

This work has been partially supported by the FIRB project RBNE01KZ94_008 financed by the Italian Ministry of University and Research (MIUR).