Optical Characterisation of a Three Layer Waveguide Structure by m-Lines Spectroscopy

Abstract

A three layer planar waveguide structure, consisting of a light guiding ferroelectric lead zirconate titanate thin film, embedded between two transparent zinc oxide electrodes, was elaborated and studied by m-lines spectroscopy. The three layer modal dispersion equations are established and we demonstrate experimentally the ability to retrieve the refraction index and the thickness of each individual layer of the composite waveguide from one single m-lines spectroscopy measurement.

Keywords:

• M-lines spectroscopy
• composite waveguide
• PZT
• ZnO
• thin film

Acknowledgment

The authors wish to thank N. Barreau from the LAMP* for the deposition of the Al doped ZnO thin films.

Notes

*LAMP, EA3825, Université de Nantes, Nantes Atlantique Universités, Faculté des Sciences et des Techniques, 2 rue de la Houssinière - BP 9208, Nantes, F-44000 France.