Abstract
The temperature dependence of the thickness of thick freestanding Films (FSF) is studied using a novel high resolution film thickness measurement technique. A small discontinuity in the temperature dependence of the smectic tilt angle at every phase transition between the ferro-, ferri-, antiferroelectric phases is observed. An additional term in the total free energy which considers an interaction between the neighboring and the next neighboring smectic layers explains this discontinuity. A comparison of the experimental results with phenomenological theory suggests that the long-range interactions are inversely proportional to the square of the distance between the layers.