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SECTION B: DIELECTRIC AND MICROWAVE PROPERTIES

Measurements of Complex Dielectric Constant of Ferroelectrics with Six-port Reflectometer in 80–120 GHz Frequency Range

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Pages 229-233 | Received 06 Sep 2007, Accepted 20 Mar 2008, Published online: 20 Sep 2010
 

Abstract

In the present work six-port reflectometer suitable for the dielectric measurements in the frequency range 80–120 GHz is described. Complex dielectic constant is very difficult to obtain the higher is the value and the higher the frequency of measurements. Presented method is presented with superior calibration method, which implies higher precision. In this paper, results of actual measurements of relaxor ceramics PLZT 8/65/35 and comparison to previous work are presented.

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