Abstract
Relaxor ferroelectric terpolymer, Poly (vinylidene fluoride-trifluoroethylene-chlorofloroethylene) can be applied in many modern electronics systems. In this paper, the terpolymer films were deposited on aluminum-coated silicon substrates by horizontal Langmuir-Blodgett technology. The X-ray diffraction pattern indicates that the films have good crystallinity. The optical dispersion of the films were measured by variable-angle spectroscopic ellipsometry over a range from 300–1300 nm. The data Ψ and Δ at multiple incident angels (θ = 75° and 85°) were fitted using the Cauchy model. The refractive index n, the extinction coefficient k and the thickness of each film were obtained.
Acknowledgments
The authors gratefully acknowledge the financial support provided by Natural Science Foundation of China (Grant Nos. 60221502, 60777044) and Natural Science Foundation of Shanghai (Grant Nos: 09JC1415800, 07JC14018 and 07ZR14129).