Abstract
Crystal structure and dielectric properties of nanocrystalline Pb(ZrxTi1-x)O3 films were studied. Intensity of Raman mode E(1LO) was increased and peak around ∼580 cm−1 became symmetric and strong (110) crystal plane reflection was observed as the thickness of the films increased from 150 nm to 500 nm. Curie-temperature was found to decrease from ∼370°C to ∼345°C as the orientation changed from tetragonal to trigonal. Dielectric constant was found to be maximized and loss angle minimized for single phase oriented films, while phase co-existence was found to increase loss angle values, and bimodal dielectric maxima were found.
Acknowledgments
Author acknowledges Foundations of Tauno Tönning and University of Oulu for financial support. Part of this research was carried out in Micro and Nanotechnology Center (MNT) of University of Oulu.