Abstract
Self-assembled formation of dense structures of oriented domain rays under application of uniform electric field was studied in single crystalline lithium niobate wafers with surface layers modified by Ar ion implantation. Two types of domain structures were observed: strictly oriented straight domain rays and cogged ones appeared due to the fingering effect. The piezoresponse force microscopy was used for high-resolution domain imaging. Geometrical characteristics of the domain patterns obtained for different strength of applied field were extracted by statistical analysis. The correlated nucleation mechanism was claimed to be responsible for the formation of observed self-assembled domain structures.
Acknowledgments
The research was made possible in part by RFBR (grants 08-02-12173-ofr, 08-02-99082-r-ofr, 10-02-96042-r-Ural-a, 10-02-00627-a), U.S. CRDF BRHE & FAE (PhD Award RNP 2.2.2.3.10017/Y4-P-05-11), by Federal Agency of Education (contract P870), by Federal Agency of Science and Innovation (contracts 02.740.11.0171 and 02.552.11.7069).