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Abstract
Effects of compressive stress on the dielectric and ferroelectric properties of commercial soft PZT ceramics were investigated. The dielectric and ferroelectric properties were measured under compressive stress applied parallel and perpendicular to an electric field direction. The results showed that the dielectric properties; i.e. the dielectric constant (ϵr) and dielectric loss tangent (tan δ), and the ferroelectric characteristics; i.e. the area of ferroelectric hysteresis (P-E) loops, the maximum polarization (Pmax), the coercive field (Ec) and the remanent polarization (Pr), changed significantly with increasing compressive stress. These changes depended greatly on direction of the applied stress. The stress clamping of domain wall, de-ageing and non-180° ferroelectric domain switching processes are responsible for the changes observed. In addition, a significant decrease in those parameters after a full cycle of stress application has been observed and attributed to the de-poling and stress-induced decrease in switchable part of spontaneous polarization at high stress. This study clearly showed that the applied stress has significant influence on the electrical properties of soft PZT ceramics.
Acknowledgments
This work was financially supported by the Industry/University Cooperative Research Center (IUCRC) in HDD Component, the Faculty of Engineering, Khon Kaen University and National Electronics and Computer Technology Center, National Science and Technology Development Agency (NSTDA). Muangjai Unruan specially acknowledges the financial support from the Thailand Research Fund through the Royal Golden Jubilee PhD Program. Faculty of Science and Graduate School of Chiang Mai University are also acknowledged for support. Partial support has been provided through the NFS grants DMR 0407462 & DMR 0844081.