Modeling of the Nanodomain Formation in the Heterostructure “SPM Tip Electrode—Thin Ferroelectric Film—Semiconductor Substrate”

Abstract

We modeled the process of cylindrical domains formation in the heterostructure “tip electrode—thin ferroelectric film—semiconductor substrate” using the Scanning Probe Microscopy (SPM). The inhomogeneous electric field induced by the SPM tip determines the distribution of electric potential on the ferroelectric surface.

During the local polarization reversal the thickness and properties of the charged layer drastically changes, in particular the depletion of carriers may be transformed into their accumulation and vise versa depending on the polarization direction. Such transformations should be accompanied by the peaks of electric current, the shape and amplitude of which depend on the domain shape and sizes. The electric current could be registered in-situ by current SPM.

Acknowledgments

Research is sponsored by Ukraine State Agency on Science, Innovation and Informatization as budget funds (Grants UU30/004 and GP/F32/099). The author also gratefully acknowledges financial support from National Academy of Science of Ukraine.