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Ferroelectrics Volume 433, 2012 - Issue 1
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Original Articles

Effect of Lead Content on Microstructure of Sol-Gel PZT Structures

A. S. Sigov Moscow State Technical University of Radioengineering, Electronics and Automation (MIREA), 78 Vernadsky prosp., Moscow, 119454, Russia
,
K. A. Vorotilov Moscow State Technical University of Radioengineering, Electronics and Automation (MIREA), 78 Vernadsky prosp., Moscow, 119454, Russia
&
O. M. Zhigalina Institute of Crystallography, Russian Academy of Science, Moscow, 117333, Russia
Pages 146-157 | Received 16 Mar 2012, Published online: 12 Sep 2012
 
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Abstract

TEM study of PZT thin films prepared by sol-gel techniques on Si - SiO2 - Ti—Pt substrates is presented. The films are subjected to a heat treatment at 650°C. Structural changes are studied in relation to lead excess in initial solution varied through a wide range from 5 to 50 mol. %. Main trends in microstructure transformation connected with the lead content are reported.

Acknowledgments

The work is supported by the grants of program of Ministry of Science and Education and RFBR N 12-02-01363-a.

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