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Abstract
The influence of the artificial surface layer (photoresist film) on the domain kinetics was studied in congruent lithium niobate single crystals. The switching current data was fitted by modified Kolmogorov-Avrami formula. The qualitative change of the domain structure evolution for photoresist film thickness above 2 μm was revealed by in situ optical visualization and analysis of the switching current data. The linear dependence of the threshold field increase on the film thickness was found. The quasi-regular nanodomain structures on Z+ polar surface were studied by scanning probe and Raman confocal microscopy and the domain evolution scenario was revealed.
Acknowledgments
The equipment of the Ural Center for Shared Use “Modern Nanotechnology”, Ural Federal University has been used. The research was made possible in part by RFBR (Grants 10-02-96042-r-Ural-а, 10-02-00627-а, 11-02-91066-CNRS-а), by Ministry of Education and Science (Contract 16.552.11.7020) and with the financial support of young scientists in terms of Ural Federal University development program.