Abstract
0.9PbSc0.5Nb0.5O3-0.1PbLu0.5Nb0.5O3ceramics were prepared by a solid-state mixed-oxide technique. The phase formation and microstructure were studied using X-ray diffraction (XRD) and scanning electron microscopy (SEM), respectively. The influences of compressive stress (0 – 1500 bar) applied parallel to the electric field on the dielectric and ferroelectric properties of these ceramics were investigated. The results showed that the compressive stress had pronounced effects on these properties. With increasing pressure, the electric permittivity maximum decreases and shifts to higher temperature, thermal hysteresis, dielectric dispersion and polarization decrease. The obtained results were interpreted mainly in terms of competing influences of the domain reorientation and stress clamping of domain wall mechanism.