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Ferroelectrics Volume 470, 2014 - Issue 1: Special Issue dedicated to Professor Amar S. Bhalla on the occasion of his 70th birthday
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Original Articles

Microstructure Analysis of Ferroelectric BaTiO3/SrTiO3 Heterostructures on LaAlO3 Substrates by High Resolution X-ray Diffraction

C. DaiState Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science & Technology of China, Chengdu, Sichuan610054, P. R. China
,
M. LiuDepartment of Physics and Astronomy, University of Texas at San Antonio, San Antonio, Texas78249, USA
,
C. R. MaDepartment of Physics and Astronomy, University of Texas at San Antonio, San Antonio, Texas78249, USA
,
C. L. ChenDepartment of Physics and Astronomy, University of Texas at San Antonio, San Antonio, Texas78249, USA;Department of Physics and the Texas Center for Superconductivity, University of Houston, Houston, Texas77204, USA
&
Y. LinState Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science & Technology of China, Chengdu, Sichuan610054, P. R. ChinaCorrespondence[email protected]
Pages 90-98 | Accepted 01 Jun 2013, Published online: 20 Oct 2014
 
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Abstract

High-resolution x-ray diffraction has been used to analyze the strain distribution and dislocation densities in epitaxial BaTiO3/SrTiO3 heterostructures. It is found that the initial layer in the heterostructures is important to the epitaxial quality and significantly affects the strain distribution, dislocation density, and the lateral coherence length in the heterostructural thin films.

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