Abstract
The e-beam recording of planar domains on the Y-face of LiNbO3 crystal was performed with an e-beam of different energies. The combination of etching, AFM and confocal SHG microscopy provided more full characterization of the fabricated planar microdomain patterns. New data were obtained on the dependence of domain formation on the irradiation conditions. It is shown that the thickness of planar domains can be affected by varying e-beam energies.
Funding
The work is partially supported by RFBR, projects No. 12-02-00596 and 13-02-12440 ofi-m, and by Program BPS “Physics of the New Materials” of the Russian Academy of Sciences.