Characterization of Piezoelectric Ceramic [Ba(Nd_0.1Ti_0.8Nb_0.1)O₃]_0.40[Na_0.5Bi_0.5TiO₃]_0.40[CaTiO₃]_0.20

Abstract

[BaNd_0.1Ti_0.8Nb_0.1O₃]_0.40[Na_0.5Bi_0.5TiO₃]_0.40[CaTiO₃]_0.20 ceramic was prepared through solid state sintering method. The phase and microstructure of ceramic sample were characterized by X-ray diffraction (XRD) and Scanning electron microscopy (SEM). The XRD results indicate that the ceramic sample have a cubic structure at room temperature. The average grain size was found to be 2 4 μm. The dielectric and piezoelectric properties were also investigated. From capacitance measurements, the values of K_t, K_eff and d₃₃ at room temperature were 0.816, 0.788 and 15.4 pm.V⁻¹ respectively. From modulus data, the K_t and K_eff at 325°C are 0.9995 and 0.9994 respectively. The piezoelectric constant (d₃₃) decreased with the increase of temperature and the value of d₃₃ at 325 °C was found to be 8.58 nm.V⁻¹.

Keywords:

• Piezoelectric
• relaxor dielectric
• impedance
• resonance and anti-resonance

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Funding

The authors would like to thank DRDO, Delhi, India for financial support in carrying the present research work.