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Ferroelectrics Volume 487, 2015 - Issue 1: Proceedings of The 9th Asian Meeting on Ferroelectrics (AMF-9) and The 9th Asian Meeting on Electroceramics (AMEC-9) (AMF-AMEC-2014)
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Original Articles

Micro-Brillouin Scattering Study on Composition Gradient Li Doped KTa1-xNbxO3 Wafer

MD. Mijanur RahamanGraduate School of Pure and Applied Sciences, University of Tsukuba, Tsukuba, Ibaraki305-8573, JapanCorrespondence[email protected]
,
Tadayuki ImaiNTT Device Innovation Center, Nippon Telegraph and Telephone Corporation, Atsugi, Kanagawa243-0198, Japan
,
Jun MiyazuNTT Device Innovation Center, Nippon Telegraph and Telephone Corporation, Atsugi, Kanagawa243-0198, Japan
,
Junya KobayashiNTT Device Innovation Center, Nippon Telegraph and Telephone Corporation, Atsugi, Kanagawa243-0198, Japan
&
Seiji KojimaGraduate School of Pure and Applied Sciences, University of Tsukuba, Tsukuba, Ibaraki305-8573, Japan
Pages 47-54 | Received 26 Oct 2014, Accepted 03 Feb 2015, Published online: 23 Dec 2015
 
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Abstract

The composition gradient Li doped KTa1-xNbxO3 wafer was investigated by micro-Brillouin scattering method. The positional dependence of elastic constants was clearly observed. The origin of positional dependence was discussed by the comparison with the temperature variation of elastic constants of the homogeneous crystal. The difference of elastic constants between high and low defect density regions was also studied.

Funding

The present research work has been supported in part by a JSPS KAKENHI Grant.

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