Processing, basic characterization and standard dielectric measurements on PLZT x/65/35 (2≤x≤13) ceramics

ABSTRACT

The influence of external stress (0-800bar) on the dielectric properties of PLZT x/65/35 (2≤x≤13) ceramics was investigated. Applying uniaxial pressure leads to a change in the peak intensity of the electric permittivity (ϵ), of its frequency dispersion as well as in the dielectric hysteresis. The peak intensity of ϵ becomes broader and shifts to lower temperatures for PLZT x/65/35 with x = 2, 4, 6, 7, 9.75, 10, 11 and 13, with increasing pressure, on heating. It was concluded that applying uniaxial pressure induces an increase of T_m, and thus has similar effects as the increase of the Ti ion concentration in the PZT system. Results based on nanoregion switching processes under combined electromechanical loading were interpreted. Surveys clearly demonstrated that applied stress has a significant influence on the dielectric properties of PLZT ceramics.

KEYWORDS:

• Ferroelectrics
• PLZT ceramics
• uniaxial pressure
• dielectric properties