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Articles

Effect of annealing temperature on crystalline structure and domains configuration of BiFeO3 films

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Pages 122-131 | Received 17 Oct 2018, Accepted 08 Jul 2018, Published online: 19 Mar 2019
 

Abstract

The BiFeO3 (BFO) thin films were prepared on Pt(111)TiO2/SiO2/Si substrates by the sol-gel method at different annealing temperatures. The crystalline structure and domain configuration of BFO films have been investigated by X-ray diffraction and piezoelectric force microscope (PFM), respectively. From the X-ray patterns, there are less impurity peaks when the BFO films are annealed at 600 °C. From the PFM images, the polarization is random and the grain size decreases with the increasing of annealing temperature. It is found that the possibility of single-domain grain formation increased with the decreasing of grain size, and the biggest single-domain grains is about 200 nm in diameter. Besides, a typical domain wall is observed, and it is 71° or 109°.

Additional information

Funding

This work was supported by the Program for Innovation Teams in University of Chongqing (Grant No. CXTDX201601032).

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