Dielectric property of perovskite La_0.86Cu₃Ti_3.42Al_0.58O₁₂ ceramic

Abstract

A novel perovskite La_0.86Cu₃Ti_3.42Al_0.58O₁₂ (LCTAO) ceramic was fabricated by a conventional solid-state method, and the dielectric property was systematically investigated. Pure phase with a body-centered cubic structure was confirmed by X-ray diffraction. High dielectric permittivity was performed in wide temperature and frequency ranges. Impedance spectroscopy analysis demonstrated microstructure was electrically heterogeneous, which resulted in a giant dielectric response based on the internal barrier layer capacitor (IBLC) model. The results of X-ray photoelectron spectroscopy indicated the active electron hopping process of the mixed-valence states charge carriers, i.e. Cu⁺/Cu²⁺, Ti³⁺/Ti⁴⁺, may be responsible for the semiconduction of grains.

Keywords:

• High permittivity
• Maxwell–Wagner polarization
• mixed valence states
• perovskite

Additional information

Funding

This work was supported by the Guangdong Basic and Applied Basic Research Foundation [2020A1515011221] and Major Scientific Research Funds of Shaoguan University under Grant [SZ2016KJ06].