X-ray specular reflection studies on multilayer films of a ferroelectric liquid crystalline polymer

Abstract

Results of our x-ray specular reflectivity studies on multilayer films of a ferroelectric liquid-crystal polymer are presented. The reflectivity curves are characterized by interference fringes (Kiessig fringes) that occur between successive Bragg peaks. Two types of intensity variations of the Kiessig fringes are observed a uniform variation and a modulated variation. The latter is shown to be due to a single-layer defect which percolates throughout the multilayer film. The electron density profiles are determined from Fourier analysis of the reflectivity.