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Section III: Posters

Thickness dependence of dielectric losses in TGSe

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Pages 313-316 | Received 03 Jul 1995, Published online: 26 Oct 2011
 

Abstract

Dielectric losses in TGSe were measured in the frequency range from 20 Hz to 1 MHz for various thicknesses. Domain wall relaxation frequencies decrease with increasing sample thickness. Temperature dependence of the domain wall relaxation frequency was also analysed.

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