Dielectric properties and structure of pure and doped (Mn, Fe, Co, Cu) PLZT 8/65/35

Abstract

The PLZT 8/65/35 compund, commonly known for relaxor behaviour, as well as PLZT 8/65/35+Me compositions (Me ‒ 3d elemment: Mn, Fe, Co, Cu) is examined a number of different technuques being used: 1) dielectric measurements of complex permeability ϵ* (v, T, E) at frequencies from 10⁻¹ to 10⁷ Hz in the range of temperature from 0 to 200°C; 2) Raman scattering (RS), EPR, X-ray diffraction (XRD) at 20°C. Behaviour of ϵ (v, T, E) is interpreted assuming existence of three differenct polarization mechanisms the partial contributions to the dielectric constant of which depends on dopant concentration and the range of frequency, temperature or field intensity. Structural criteria are proposed to evaluate contributions of each of the mechanisms.

Key Words:

• PLZT 8/65/35 compound
• relaxor behaviour
• dopant effects
• 3d elements
• polarization mechanisms