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Abstract
Pb0.6Sr0.4TiO3 (PSrT) thin films are grown on various substrates such as: (m00)-textured La0.5Sr0.5CoO3 (LSCO)/Si, In2Sn2O7-x (ITO)/glass and amorphous glass using Pulse-laser-deposition (PLD). X-ray diffraction results show that the structure and the lattice parameters of the substrate greatly influence the growth of PSrT films. For example, (001)-oriented PSrT films can be successfully deposited on the substrates with (m00)-textured LSCO films and ITO/glass substrates. (100)-like PSrT films tend to grow on the amorphous glass substrates. Both element diffusion and structure stability were found to play an important role on the ferroelectric properties of these deposited films. Microstructural characteristics as well as the electric and optical properties are compared and discussed.