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Research Articles

The supplier–buyer integrated production-inventory model with random yield

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Pages 4043-4061 | Received 29 Oct 2009, Accepted 05 Mar 2010, Published online: 06 Jul 2010
 

Abstract

This paper revisits the traditional supplier–buyer integrated production-inventory model which deals with the problem of a manufacturer (supplier) supplying a product to a retailer (buyer) serving the consumer market with constant stationary demand. The product is manufactured in batches at a finite rate. The supplier's production batch is depleted by the buyer's replenishment orders at periodic intervals. The buyer's inventory is then consumed by the market demand at a fixed rate. The problem is the simultaneous computation of the manufacturer's production lot-size and the buyer's replenishment order quantity, i.e. the integrated production-inventory policy parameters. The key characteristic considered in this paper is that the manufacturing process is imperfect, and, hence, there are defective items in each production lot. As a result, each replenishment order shipped to the buyer includes defective products and the non-defective percentage in each such shipment is random. Considering the case where the supplier replenishes the buyer via equal-sized shipments, we develop an analytical expression of the total expected cost for the supplier–buyer system under consideration, with and without a considerable inspection time. We first examine the case where the inspection time is negligible, and then we present a generalisation to consider the inspection time explicitly. Our goal is to model the impact of random yield on the system performance. Our findings are useful for computing the integrated production-inventory policy parameters while considering the supply uncertainty due to an imperfect manufacturing process. Through numerical examples, we quantify the impact of supply with random yield on the system performance and illustrate its relationship with the demand and production rate.

Acknowledgement

This research was supported, in part, by NSF grant CAREER/DMI-0093654.

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