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Abstract
Taguchi's off-line quality control methods for product and process improvement emphasize experiments to design quality “into” products and processes. In Very Large Scale Integrated (VLSI) circuit design, the application of interest here, computer modeling is invariably quicker and cheaper than physical experimentation. Our approach models quality characteristics generated by the computer simulation as functions of both the engineering and noise parameters. This single experimental design for both types of parameters typically requires far fewer runs. The model is used to predict the quality characteristics, from which loss statistics can also be predicted and optimized. In the VLSI applications described, we obtain effective prediction of product performance with comparatively few observations.
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Notes on contributors
William J. Welch
Dr. Welch is an Associate Professor in the Department of Statistics and Actuarial Science and in the Institute for Improvement in Quality and Productivity.
Tat-Kwan Yu
At the time of this research, Dr. Yu was a graduate student in the Department of Electrical and Computer Engineering. He is now with the Advanced Products Research and Development Laboratory, Motorola, Inc., Austin, Texas.
Sung Mo Kang
Dr. Kang is a Professor in the Department of Electrical and Computer Engineering and a Research Professor in the Coordinated Science Laboratory.
Jerome Sacks
Dr. Sacks is Professor and Head, Department of Statistics.