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Abstract
In high-yield processes with a low defect rate, the recommendation is to monitor the times between events (TBE) with variables control charts in order to overcome the weaknesses of conventional attribute control charts. In this paper, we incorporate supplementary runs rules into one of the existing Shewhart-type TBE charts, namely the tr -chart, in order to improve its small to moderate size-shift detection ability. Moreover, because the existing tr -chart based on probability limits is biased, we provide a procedure for designing a tr -chart, with or without runs rules, that is unbiased. The performance of several tr -charts with runs rules is investigated, whereas comparisons with EWMA and CUSUM charts are also given. It is seen that some of the runs rules enhanced tr -charts perform substantially better. A real-data example is provided for illustration and some concluding remarks are given.
Additional information
Notes on contributors
N. Kumar
Dr. Kumar is an Assistant Professor in the Department of Statistics. His email address is [email protected].
S. Chakraborti
Dr. Chakraborti is a Professor in the Department of Information Systems, Statistics and Management Science. His email address is [email protected].
A. C. Rakitzis
Dr. Rakitzis is a Lecturer in the Department of Mathematics. He is the corresponding author. His email address is [email protected].
