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Spectroscopy Letters
An International Journal for Rapid Communication
Volume 51, 2018 - Issue 6
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Articles

X- and gamma-ray irradiation effects on vanadium pentoxide thin films

Demet YılmazDepartment of Physics, Faculty of Sciences, Atatürk University, Erzurum, Turkey; Correspondence[email protected]
,
Betül GüzeldirDepartment of Physics, Faculty of Sciences, Atatürk University, Erzurum, Turkey;
,
Tuba AkkuşDepartment of Physics, Faculty of Arts and Sciences, Erzincan University, Erzincan, Turkey;
&
Tuba ÖznülüerDepartment of Chemistry, Faculty of Science, Atatürk University, Erzurum, Turkey
Pages 297-301 | Received 13 Dec 2017, Accepted 08 May 2018, Published online: 01 Jun 2018
 
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Abstract

Thickness and composition of thin films can be measured with X- and gamma-rays. In this work, thickness and composition of vanadium pentoxide thin films are investigated by energy dispersive and wavelength dispersive X-ray fluorescence systems. Also, the surface analysis of vanadium pentoxide thin films irradiated with Rhodium Kα X-rays and 59.54 keV gamma-rays emitted from 100 mCi and 5 Ci Americium-241 radioactive sources is performed by scanning electron microscope. It is observed that X- and gamma-rays are destructive for vanadium pentoxide thin films. Also, the composition of vanadium pentoxide thin films changes by irradiation with X- and gamma-rays.

Acknowledgments

The authors would like to thank Yusuf ŞAHİN for useful comments on the manuscript.

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