Studies on Polybenzoxazine/Capron PK₄/octakis(dimethylsiloxypropylglycidylether) Silsesquioxane Nanocomposites for Radiation Resistant Applications

Abstract

Polymeric materials can erode when exposed to the radiation environment that includes atomic oxygen (AO), ultraviolet (UV) ionizing radiation, and ultrahigh vacuum (UHV). Many studies have been devoted to develop polymeric materials that can withstand decades of exposure on radiation. In this connection an attempt has been made to develop polyhedral oligomeric silsesquioxane (POSS) reinforced capron PK₄ (CPL) modified polybenzoxazine nanocomposites in the present work and to assess their ability to resist radiation for a prolonged period. Varying weight percentages of (0, 1, 3, and 5 wt%) POSS were reinforced in to 1:1 (w/w) PBZ/CPL copolymerization through chemical ring opening polymerization. The POSS reinforced PBZ/CPL nanocomposites have been studied their tensile strength and morphological behavior before and after exposure of UV irradiation. Data resulted from the studies indicated that the neat PBZ-CPL has significantly eroded after UV exposure, whereas POSS reinforced PBZ/CPL composites have eroded only an insignificant extent and the value of tensile properties are reduced to a small extent. The POSS reinforced nanocomposites during exposure under UV radiation undergo changes on the surface and lead to the formation of silica (Si-O-Si) passivation layer. The formation of silica layer protects (act as inert layer) from further erosion of the composites and was ascertained from SEM images. Data obtained from thermal and dielectric studies indicate that thermal stability and dielectric behavior of composites were appreciably improved when compared with those of neat PBZ/CPL matrix.

Keywords:

• Benzoxazine
• capron PK₄
• morphology
• OG-POSS
• tensile strength
• UV radiation

Acknowledgments

The authors sincerely thank to Dr. M. R. Vengatesan and Dr. S. Devaraju, South Korea, for their support. The authors thank Dr. R. Jayavel, Director, and Mr. D. Selva Kumar, Research Scholar, Centre for Nanoscience and Technology, Anna University, for impedance analysis and PSG College of Technology, Coimbatore, for TEM analysis.

Notes

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