38
Views
29
CrossRef citations to date
0
Altmetric
Original Articles

A comparison of X-ray (STEM) and Auger electron spectroscopy for the microanalysis of grain boundary segregation

, &
Pages 759-768 | Received 02 Feb 1978, Published online: 27 Sep 2006
 

Abstract

Auger electron spectroscopy and STEM X-ray microanalysis have been used to measure grain boundary segregations in iron-based alloys. Analyses have been carried out on iron-3 wt.% nickel alloys containing additions of either tin or phosphorous which have been embrittled by heat treatment at 823 K. The results of the two analyses are discussed and used to compare critically this application of the techniques.

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.