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Original Articles

On the mechanism of diffusion-induced boundary migration

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Pages 333-340 | Received 23 Apr 1980, Accepted 11 Nov 1980, Published online: 27 Sep 2006
 

Abstract

A grain-boundary-dislocation mechanism for diffusion-induced boundary migration is proposed. It is suggested that point-defect emission from grain-boundary dislocations is necessary for the solution and transport of substitutional solutes. Grain-boundary migration occurs as a by-product of the emission of point defects, owing to the requirement that the dislocation remain in the grain-boundary plane.

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