Abstract
Dislocations in solution-grown crystals of cyclotrimethylene trinitramine (RDX) have been observed and characterized by transmission X-ray topography. The dislocations were found to have the following Burgers vectors: [001], [010], [100], 〈011〉 and 〈110〉. With the exception of one pure edge dislocation type they were all of mixed character. A few of the dislocations were straight and showed characteristics typical of growth induced dislocations. Most, however, exhibited irregular line directions indicative of post-growth motion. In addition, a number of narrow dislocation helices were observed. The observed dislocation configurations are discussed in terms of climb, cross-slip and combined climb/slip mechanisms. Evidence is presented for the existence of an alternative (001) slip plane additional to the (010) plane previously defined by microhardness indentation.